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STEM-EELS Exploration of Beam-Sensitive Perovskite Nanocrystals

Published online by Cambridge University Press:  22 July 2022

Brittany Ford ,
David W. McComb ,
Michael Brennan  and
Tod Grusenmeyer
Brittany Ford*
Affiliation:
Department of Materials Science & Engineering, The Ohio State University, Columbus, OH, United States
David W. McComb
Affiliation:
Department of Materials Science & Engineering, The Ohio State University, Columbus, OH, United States Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, United States
Michael Brennan
Affiliation:
Air Force Research Laboratory, WPAFB, OH, United States
Tod Grusenmeyer
Affiliation:
Air Force Research Laboratory, WPAFB, OH, United States
*
*Corresponding author: [email protected]

Abstract

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Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2160 - 2161
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Copyright
Copyright © Microscopy Society of America 2022

References

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