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STEM SI Warp: A Tool for Correcting the Linear and Nonlinear Distortions for Atomically Resolved STEM Spectrum and Diffraction Imaging

Published online by Cambridge University Press:  01 August 2018

Yi Wang ,
Y. Eren Suyolcu ,
Ute Salzberger ,
Kersten Hahn ,
Vesna Srot ,
Wilfried Sigle  and
Peter A. van Aken
Yi Wang
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Stuttgart, Germany
Y. Eren Suyolcu
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Stuttgart, Germany
Ute Salzberger
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Stuttgart, Germany
Kersten Hahn
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Stuttgart, Germany
Vesna Srot
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Stuttgart, Germany
Wilfried Sigle
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Stuttgart, Germany
Peter A. van Aken
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Stuttgart, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 132 - 133
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Kimoto, K, et al, Nature 450 2007) p 702.Google Scholar
[2] Lu, P, et al, Sci. Rep 4 2014) p 3945.Google Scholar
[3] Yankovich, A B, et al, Nanotechnology 27 2016) p 364001.Google Scholar
[4] Jeong, J S Mkhoyan, K A Microsc. Microanal 22 2016) p 1.Google Scholar
[5] Wang, Y, et al, Ultramicroscopy 184 2018) p 98.Google Scholar
[6] Wang, Y, et al, Microscopy 2018 https://doi.org/10.1093/jmicro/dfy002.Google Scholar