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STEM SI Warp: a Digital Micrograph script tool for warping the image distortions of atomically resolved spectrum image

Published online by Cambridge University Press:  04 August 2017

Yi Wang
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany
Ute Salzberger
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany
Vesna Srot
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany
Wilfried Sigle
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany
Peter A. van Aken
Affiliation:
Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Heisenbergstr. 1, 70569 Stuttgart, Germany

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Schaffer, B in Transmission Electron Microscopy, Diffraction, Imaging, and Spectrometry (ed. C.B. Carter & D.B. WilliamsSpringer SwitzerlandChapter 6, p 167.Google Scholar
[2] Mitchell, D R G & Schaffer, B Ultramicroscopy 103 2005). p. 319.CrossRefGoogle Scholar
[4] Wang, Y, etal, ACS Appl.Mater.Interfaces 8 2016). p. 6763.CrossRefGoogle Scholar
[5] Baiutti, F, et al, ACS Appl.Mater.Interfaces 8 2016). p. 27368.CrossRefGoogle Scholar
[6] The research leading to these results has received funding from the European Union Seventh Framework Program under Grant Agreement 312483-ESTEEM2 (Integrated Infrastructure Initiative I3).Google Scholar