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STEM EBIC Thermometry Calibration with PEET on Al Nanoparticles

Published online by Cambridge University Press:  30 July 2020

William Hubbard ,
Matthew Mecklenburg  and
B. C. Regan
William Hubbard
Affiliation:
NanoElectroning Imaging, Inc. (NEI), Los Angeles, California, United States
Matthew Mecklenburg
Affiliation:
University of Southern California, Los Angeles, California, United States
B. C. Regan
Affiliation:
UCLA Department of Physics & Astronomy, Los Angeles, California, United States

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 3124 - 3125
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Copyright
Copyright © Microscopy Society of America 2020

References

Hubbard, WA et al. ., Physical Review Applied 10 (2018), p. 044066.10.1103/PhysRevApplied.10.044066CrossRefGoogle Scholar
Hubbard, WA et al. ., Applied Physics Letters 115 (2019), p. 133502.10.1063/1.5117055CrossRefGoogle Scholar
Mecklenburg, M et al. ., Ultramicroscopy 207 (2019), p. 112852.10.1016/j.ultramic.2019.112852CrossRefGoogle Scholar
Mecklenburg, M et al. ., Science 347 (2015), p. 629-632.10.1126/science.aaa2433CrossRefGoogle Scholar
Lagos, M et al. ., Nano Letters 18 (2018), p. 4556-4563.10.1021/acs.nanolett.8b01791CrossRefGoogle Scholar
Idrobo, J C et al. ., Physical Review Letters 120 (2018), p. 095901.10.1103/PhysRevLett.120.095901CrossRefGoogle Scholar
Wehmeyer, G et al. ., Applied Physics Letters 113 (2018), p. 253101.10.1063/1.5066111CrossRefGoogle Scholar
This material is based upon work supported by the Defense Microelectronic Activity under Contract No. HQ072720P0004, and by NSF STC award DMR-1548924 (STROBE), NSF award DMR-1611036, and the UCLA PSEIF.Google Scholar