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STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO2

Published online by Cambridge University Press:  04 August 2017

William A. Hubbard ,
Toyanath Joshi ,
Matthew Mecklenburg ,
Brian Zutter ,
Pavel Borisov ,
David Lederman  and
B. C. Regan
William A. Hubbard
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA
Toyanath Joshi
Affiliation:
Department of Physics and Astronomy, West Virginia University, Morgantown, WV, USA
Matthew Mecklenburg
Affiliation:
Center for Electron Microscopy and Microanalysis, University of Southern California, Los Angeles, CA, USA
Brian Zutter
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA
Pavel Borisov
Affiliation:
Department of Physics and Astronomy, West Virginia University, Morgantown, WV, USA
David Lederman
Affiliation:
Department of Physics and Astronomy, West Virginia University, Morgantown, WV, USA Department of Physics, University of California, Santa Cruz, CA, USA
B. C. Regan
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1428 - 1429
Copyright
© Microscopy Society of America 2017 

References

[1] Bolzan, AA, et al, Journal of Solid State Chemistry 113 1994). p. 9–14.Google Scholar
[2] Joshi, T, et al, Journal of Physics D: Applied Physics 48 2015). p. 335308.Google Scholar
[3] Hubbard, WA, et al, Microscopy and Microanalysis 22(S3 2016). p. 1254–1255.Google Scholar
[4] This work has been supported by FAME, one of six centers of STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA, by National Science Foundation (NSF) award DMR-1611036, and by NSF STC award DMR-1548924. The authors acknowledge the use of instruments at the Electron Imaging Center for NanoMachines supported by NIH 1S10RR23057 and the CNSI at UCLA, as well as the Shared Research Facilities at WVU.Google Scholar