Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-28T16:57:28.677Z Has data issue: false hasContentIssue false
  • English
  • Français

STEM Characterization of Defects Generated During the Stress-Induced Martensitic Transformation in NiTi Microcrystals

Published online by Cambridge University Press:  23 November 2012

M.L. Bowers ,
S. Manchiraju ,
P.M. Anderson  and
M.J. Mills
M.L. Bowers
Affiliation:
Materials Science and Engineering, The Ohio State University, Columbus, OH
S. Manchiraju
Affiliation:
Materials Science and Engineering, The Ohio State University, Columbus, OH
P.M. Anderson
Affiliation:
Materials Science and Engineering, The Ohio State University, Columbus, OH
M.J. Mills
Affiliation:
Materials Science and Engineering, The Ohio State University, Columbus, OH
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 754 - 755
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)