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Statistical Analysis of Secondary Electron Spectroscopic Images Using Ultra-Low Energies Reveal Nanoscale Surface Morphology of Functional Organic Blends

Published online by Cambridge University Press:  01 August 2018

Jochen Kammerer
Affiliation:
Centre for Advanced Materials, Heidelberg University, Heidelberg, Germany
Riva Alkarsifi
Affiliation:
UMR CNRS 7325, CINaM, Aix Marseille Universite, Marseille, France
Christine Videlot-Ackermann
Affiliation:
UMR CNRS 7325, CINaM, Aix Marseille Universite, Marseille, France
Olivier Margeat
Affiliation:
UMR CNRS 7325, CINaM, Aix Marseille Universite, Marseille, France
Bernd Schindler
Affiliation:
Carl Zeiss Microscopy GmbH, Oberkochen, Germany
Irene Wacker
Affiliation:
Centre for Advanced Materials, Heidelberg University, Heidelberg, Germany Cryo Electron Microscopy, Heidelberg University / Medical Faculty, Heidelberg, Germany
Jorg Ackermann
Affiliation:
UMR CNRS 7325, CINaM, Aix Marseille Universite, Marseille, France
Rasmus R Schroder
Affiliation:
Centre for Advanced Materials, Heidelberg University, Heidelberg, Germany Cryo Electron Microscopy, Heidelberg University / Medical Faculty, Heidelberg, Germany
Martin Pfannmoller
Affiliation:
Centre for Advanced Materials, Heidelberg University, Heidelberg, Germany

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Pfannmoller, M, Kowalsky, W Schroder, RR Energy & Environmental Science 6 2013) p. 2871.Google Scholar
[2] Pfannmoller, M, et al, Nano Letters 11 2011) p. 3099.Google Scholar
[3] cf. RR Schroder et al, Microscopy and Microanalysis Conference Proceedings of this conference.Google Scholar
[4] Li, P Egerton, RF Microscopy and Microanalysis 9 2003) p. 986.Google Scholar
[5] The authors acknowledge funding of the DELTA project by the ministry of Research and Education to R.R.S (FKZ: 13GW0044), and funding of J.K. and M.P. by the ministry of research, Baden-Wurttemberg, through the HEiKA materials research centre FunTECH-3D.Google Scholar