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Standardless Quantification at Trace Elemental (PPM) Levels Using a Novel Attachment within an Electron Microscope and Microprobe

Published online by Cambridge University Press:  25 July 2016

Wenbing Yun ,
SH Lau ,
Benjamin Stripe ,
Alan Lyon ,
David Reynolds ,
Sharon Chen ,
Richard Ian Spink  and
Sylvia JY Lewis
Wenbing Yun
Affiliation:
Sigray, Inc. Imhoff Drive, Suite I, Concord, CAUSA
SH Lau
Affiliation:
Sigray, Inc. Imhoff Drive, Suite I, Concord, CAUSA
Benjamin Stripe
Affiliation:
Sigray, Inc. Imhoff Drive, Suite I, Concord, CAUSA
Alan Lyon
Affiliation:
Sigray, Inc. Imhoff Drive, Suite I, Concord, CAUSA
David Reynolds
Affiliation:
Sigray, Inc. Imhoff Drive, Suite I, Concord, CAUSA
Sharon Chen
Affiliation:
Sigray, Inc. Imhoff Drive, Suite I, Concord, CAUSA
Richard Ian Spink
Affiliation:
Sigray, Inc. Imhoff Drive, Suite I, Concord, CAUSA
Sylvia JY Lewis
Affiliation:
Sigray, Inc. Imhoff Drive, Suite I, Concord, CAUSA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 436 - 437
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Bell, DC Energy Dispersive X-ray Analysis in the Electron Microscope (2003).Google Scholar
[2] Newbury, DE Scanning (2013).Google ScholarPubMed
[3] Acknowledgments go to the NSF, Division of Industrial Innovation & Partnerships for funding the development of x-ray mirror lens (IIP-1448727) and to the NIH, National Institute of General Medicine Science for funding the development of the microstructured source target (GRANT11545218).Google Scholar