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Standardization and Metrology for Efficiency and Reliability in Microbeam Analysis - No pain, no gain

Published online by Cambridge University Press:  23 September 2015

Vasile-Dan Hodoroaba ,
Ryna B. Marinenko ,
Mike Matthews  and
Jiang Zhao
Vasile-Dan Hodoroaba
Affiliation:
BAM Federal Institute for Materials Research and Testing, Division 6.8 Surface Analysis and Interfacial Chemistry, 12200 Berlin, Germany
Ryna B. Marinenko
Affiliation:
National Institute of Standards and Technology (NIST), Materials Measurement Science Division, Microanalysis Research Group, Gaithersburg, MD 20899, USA
Mike Matthews
Affiliation:
17 Circuit Lane, RG30 3HB Reading, Great Britain
Jiang Zhao
Affiliation:
Institute of Chemistry, SAC, #2 Zhong Guan Cun Bei Yi Jie Beijing, 100190, China

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1477 - 1478
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] ISO/IEC 17025 (2005). General requirements for the competence of testing and calibration laboratories. ISO, Geneve.Google Scholar
[2] http://www.iso.org (Standard developments / Technical Committees / ISO/TC 202 Microbeam analysis).Google Scholar
[3] http://www.bipm.org/en/committees/cc/ccqm/.Google Scholar
[4] Hodoroaba, V-D, et al, Microsc. Microanal 20(Suppl 3), 2014, p. 730.CrossRefGoogle Scholar
[5] ISO/IEC Guide 98-3: 2008. Uncertainty of measurement Part 3: Guide to the expression of uncertainty in measurement (GUM:1995), Geneva: Internat. Org. Stds, 101 pp.Google Scholar
[6] http://www.vamas.org/.Google Scholar