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Spectral Simulation With Nist-Nih Desktop Spectrum Analyzer (Dtsa): A Critical Tool for Estimating Limits of Detection

Published online by Cambridge University Press:  02 July 2020

Dale E. Newbury
Dale E. Newbury*
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD20899-8371
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Extract

X-ray microanalysis often must estimate limits of detection for specific specimen compositions to optimize analytical strategy and to adequately describe results. Several approaches are available which make use of experimentally measured spectra to obtain peak and local background intensities. One of the oldest and simplest involves the use of pure element spectra. However, such an estimate procedure does not take into account the matrix effects, particularly absorption, which can be quite important in defining limits of detection in a particular multi-element composition. If a microhomogeneous standard is available with the appropriate matrix that also contains the other constituent(s) of interest at a known level, ideally at a minor constituent level (0.01 to 0.1 mass fraction), then the limit of detection, CDL, can be estimated through the use of the expression:

Type
Problem Elements and Spectrometry Problems II
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 936 - 937
Copyright
Copyright © Microscopy Society of America

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References

References:

1.Goldstein, J. I., et al., Scanning Electron Microscopy and X-ray Microanalysis, New York, Plenum Press (1992) 413.CrossRefGoogle Scholar
2.Fiori, C. E. and Swyt, C. R., United States Patent 5,299,138 (March 29, 1994) Desk Top Spectrum Analyzer. NIST-NIH Desktop Spectrum Analyzer is freely available from the NIST Worldwide Web site http://www.cstl.nist.gov/div837/837.02/MicroscopySoftware.htmlGoogle Scholar
3.Newbury, D. E., et al., Microbeam Analysis, 4 (1995) 221.Google Scholar