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Spatially-Resolved X-Ray Absorption fine Structure (XAFS) Spectroscopy Using Undulator Radiation Focused by Dynamically-Bent Elliptical Mirrors

Published online by Cambridge University Press:  02 July 2020

S. R. Sutton ,
P. E. Eng ,
M. L. Rivers  and
M. Newville
S. R. Sutton
Affiliation:
Consortium for Advanced Radiation Sources, The University of Chicago, Chicago, IL, 60637, USA Department of the Geophysical Sciences, The University of Chicago, Chicago, IL, 60637, USA
P. E. Eng
Affiliation:
Consortium for Advanced Radiation Sources, The University of Chicago, Chicago, IL, 60637, USA
M. L. Rivers
Affiliation:
Consortium for Advanced Radiation Sources, The University of Chicago, Chicago, IL, 60637, USA Department of the Geophysical Sciences, The University of Chicago, Chicago, IL, 60637, USA
M. Newville
Affiliation:
Consortium for Advanced Radiation Sources, The University of Chicago, Chicago, IL, 60637, USA
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X-ray absorption spectroscopy (XANES and EXAFS) applied with x-ray microprobe instrumentation (figures 1) can be used for studying the electronic structure of specific elements in complex materials in a spatially-resolved manner (figure 2). Such techniques are valuable in a wide range of studies including hydrothermal fluid processes, migration and encapsulation of toxic and radioactive wastes, and redox evolution of solar system bodies.

One of the major technical challenges in this work is the production of high flux microbeams from high power, hard x-ray synchrotron sources. Some of the microbeam technologies under development include tapered glass capillaries, zone plates, and elliptical mirrors. Each approach has advantages and disadvantages and the optimum microfocusing device depends on the particular experiment.

One of the most versatile of these devices is the dynamically bent, elliptical mirror, especially when a pair of mirrors are arranged in a Kirkpatrick-Baez (KB) geometry to provide two-dimensional focusing. This versatility derives mainly from four attributes.

Type
Novel X-Ray Methods: From Microscopy to Ultimate Detectability
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 364 - 365
Copyright
Copyright © Microscopy Society of America

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References

1.Heald, S. M. et al., J. Phys. IV France 7 (1997).CrossRefGoogle Scholar
2.Yun, W. et al., Rev. Sci. Instrum. 67 (1996).Google Scholar
3.Yang, B. X., Rivers, M., Schildkamp, W and Eng, P. J., Rev. Sci. Instrum. 66, 22789 (1995).Google Scholar
4.Eng, P. J., Rivers, M., Yang, M. B. X. and Schildkamp, W., In X-ray Microbeam Technology and Applications, Yun, W., ed., Proc. 2516, 41 (1995).Google Scholar
5. The work is supported by the U.S. National Science Foundation, the U.S. Department of Energy and the W. M. Keck Foundation.Google Scholar