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A Single-Tilt TEM Stereomicroscopy Technique for Crystalline Materials

Published online by Cambridge University Press:  31 January 2003

Rodney J. McCabe ,
Amit Misra ,
Terence E. Mitchell  and
Kathleen B. Alexander
Rodney J. McCabe
Affiliation:
Los Alamos National Laboratory, MST-8 Structure/Property Relations, Los Alamos, NM 87545, USA
Amit Misra
Affiliation:
Los Alamos National Laboratory, MST-8 Structure/Property Relations, Los Alamos, NM 87545, USA
Terence E. Mitchell
Affiliation:
Los Alamos National Laboratory, MST-8 Structure/Property Relations, Los Alamos, NM 87545, USA
Kathleen B. Alexander
Affiliation:
Los Alamos National Laboratory, MST-8 Structure/Property Relations, Los Alamos, NM 87545, USA
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Abstract

A new single-tilt technique for performing TEM stereomicroscopy of strain fields in crystalline materials has been developed. The technique is a weak beam technique that involves changing the value of g and/or sg while tilting across a set of Kikuchi bands. The primary benefit of the technique is it can be used with single-tilt TEM specimen holders including many specialty holders such as in situ straining, heating, and cooling holders. Standard stereo-TEM techniques are almost always limited to holders allowing two degrees of rotational freedom (i.e., double-tilt or tilt/rotation holders). An additional benefit of the new technique is that it eliminates the need to focus with the specimen height control. These advantages make it useful for stereo viewing or for quantitative stereomicroscopy provided necessary consideration is given to errors that may result from the technique.

Keywords

stereomicroscopystereoTEMin situ TEMdislocationsweak beam
Type
Instrumentation and Technique
Information
Microscopy and Microanalysis , Volume 9 , Issue 1 , February 2003 , pp. 29 - 35
Copyright
© 2003 Microscopy Society of America

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