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Simultaneous High-Speed DualEELS and EDS acquisition at atomic level across the LaFeO3 / SrTiO3 interface

Published online by Cambridge University Press:  23 September 2015

P. Longo ,
T. Topuria ,
P. Rice ,
A Aitouchen ,
P.J. Thomas  and
R.D. Twesten
P. Longo
Affiliation:
Gatan Inc. 5794 W Las Positas Blvd, Pleasanton, CA, 94588, USA
T. Topuria
Affiliation:
IBM Research Division, Almaden Research Center, San Jose, CA, 95120, USA
P. Rice
Affiliation:
IBM Research Division, Almaden Research Center, San Jose, CA, 95120, USA
A Aitouchen
Affiliation:
Gatan Inc. 5794 W Las Positas Blvd, Pleasanton, CA, 94588, USA
P.J. Thomas
Affiliation:
Gatan Inc. 5794 W Las Positas Blvd, Pleasanton, CA, 94588, USA
R.D. Twesten
Affiliation:
Gatan Inc. 5794 W Las Positas Blvd, Pleasanton, CA, 94588, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1857 - 1858
Copyright
Copyright © Microscopy Society of America 2015