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Simulating Atomic Resolution STEM Images of Non-Periodic Samples

Published online by Cambridge University Press:  03 August 2008

SD Findlay ,
AJ D'Alfonso ,
LJ Allen ,
MP Oxley ,
PD Nellist ,
EC Cosgriff ,
G Behan ,
A Kirkland ,
N Shibata  and
T Mizoguchi
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SD Findlay
Affiliation:
University of Tokyo, Japan
AJ D'Alfonso
Affiliation:
University of Melbourne, Australia
LJ Allen
Affiliation:
University of Melbourne, Australia
MP Oxley
Affiliation:
Oak Ridge National Laboratory
PD Nellist
Affiliation:
University of Oxford, United Kingdom
EC Cosgriff
Affiliation:
University of Oxford, United Kingdom
G Behan
Affiliation:
University of Oxford, United Kingdom
A Kirkland
Affiliation:
University of Oxford, United Kingdom
N Shibata
Affiliation:
University of Tokyo, Japan
T Mizoguchi
Affiliation:
University of Tokyo, Japan
Y Ikuhara
Affiliation:
University of Tokyo, Japan
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 928 - 929
Copyright
© 2008 Microscopy Society of America

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