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SIMS Detector on FIB/SEM DualBeam Microscopes for Material Science Applications

Published online by Cambridge University Press:  30 July 2020

Chengge Jiao ,
Xu Xu ,
Timothy Burnett ,
Mikhail Dutka ,
David Wall  and
Brandon van Leer
Chengge Jiao
Affiliation:
ThermoFisher Scientific, Eindhoven, Noord-Brabant, Netherlands
Xu Xu
Affiliation:
The University of Manchester, Manchester, England, United Kingdom
Timothy Burnett
Affiliation:
The University of Manchester, Manchester, England, United Kingdom
Mikhail Dutka
Affiliation:
ThermoFisher Scientific, Eindhoven, Noord-Brabant, Netherlands
David Wall
Affiliation:
ThermoFisher Scientific, Eindhoven, Noord-Brabant, Netherlands
Brandon van Leer
Affiliation:
ThermoFisher Scientific, Hillsboro, Oregon, United States

Abstract

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Type
FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 408 - 409
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Copyright
Copyright © Microscopy Society of America 2020

References

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Jiao, Chengge, Pillatsch, Lex, Mulders, Johannes, Wall, David, Microscopy and Microanalysis 25(S2):876–877, DOI: 10.1017/S143192761900511710.1017/S1431927619005117CrossRefGoogle Scholar
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