Hostname: page-component-cd9895bd7-mkpzs Total loading time: 0 Render date: 2024-12-26T19:58:45.392Z Has data issue: false hasContentIssue false
  • English
  • Français

A Simple Method For Determining Optimum Corrections For High-Accuracy Epma In Difficult Chemical Systems

Published online by Cambridge University Press:  01 August 2002

J. T. Armstrong ,
R. B. Marinenko  and
J. M. Davis
J. T. Armstrong
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-8371
R. B. Marinenko
Affiliation:
Undergraduate School of Engineering, Clemson University, Clemson, SC 29634-0911
J. M. Davis
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-8371 Undergraduate School of Engineering, Clemson University, Clemson, SC 29634-0911

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 438 - 439
Copyright
Copyright © Microscopy Society of America 2002