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Silicon Drift Detectors: Limitations for Throughput and Resolution

Published online by Cambridge University Press:  04 August 2017

Jens Rafaelsen
Jens Rafaelsen*
Affiliation:
EDAX Inc, A Division of Ametek, Materials Analysis Division, Mahwah, NJ

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 50 - 51
Copyright
© Microscopy Society of America 2017 

References

[1] Struder, L., et al, Mikrochimica Acta, Supplement 15 1998). p 11.Google Scholar
[2] Fiorini, L. B. C., et al IEEE Nuclear Science Symposium Conference Record (2011) p. 1972.Google Scholar