Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-25T11:15:35.097Z Has data issue: false hasContentIssue false
  • English
  • Français

Silicon Drift Detectors in Electron Microscopy - An Over 20 Year History with a Bright Future

Published online by Cambridge University Press:  01 August 2018

A. Liebel ,
A. Schöning ,
A. Bechteler ,
K. Hermenau ,
K. Heinzinger ,
L. Strüder ,
A. Niculae  and
H. Soltau
A. Liebel
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
A. Schöning
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
A. Bechteler
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
K. Hermenau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
K. Heinzinger
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
L. Strüder
Affiliation:
University of Siegen, Department of Physics, Walter-Flex-Str. 3, 57068Siegen, Germany
A. Niculae
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany
H. Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, D-81739München, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 796 - 797
Copyright
© Microscopy Society of America 2018 

References

[1] Strüder, L, et al, Microscopy & Microanalysis volume 4 1999) pp. 622–631.Google Scholar
[2] Niculae, A, et al, Proceedings of Microscopy & Microanalysis volume 22(S3 2016) pp. 42–43.Google Scholar
[3] Schlossmacher, P, et al, Microscopy Today vol. 18(4 2010) pp. 14–20.Google Scholar
[4] von Harrach, HS, et al, Journal of Physics Conference Series volume 241(1), ( 2010.Google Scholar
[5] Niculae, A, et al, Proceedings of Microscopy & Microanalysis volume 22(S3 2016) pp. 40–41.Google Scholar
[6] Bombelli, L., et al, IEEE Nuclear Science Symposium Conference (NSS/MIC), ISBN 978-1-42449105-6 (2010).Google Scholar