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SI(LI) and Hpg Detectors: Recent Measurements

Published online by Cambridge University Press:  02 July 2020

R A Sareen  and
T Nashashibi
R A Sareen
Affiliation:
Gresham Scientific Instruments Ltd., Globeside Business Park, Marlow England, SL7 1TB
T Nashashibi
Affiliation:
Gresham Scientific Instruments Ltd., Globeside Business Park, Marlow England, SL7 1TB
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Extract

Small Si (Si(Li), Intrinsic Si, PEN diodes) and Ge (HPG) planar detectors are used for measuring the energy and intensity of X-rays at low energies (below 100 keV). Applications include energy dispersive microanalysis in the electron microscope and x-ray fluorescence in tube excited systems. They are also finding increasing use on synchrotron beam lines. Both types of detector have unique and special properties and there is a wealth of information in the literature1 describing their principles of operation including their spectral characteristics.

For example, the superior resolution (110 eV compared to 130 eV (FWHM) at 5.9 keV) obtained with 10 mm2 HPG detectors is a consequence of Ge's smaller band gap (0.7 eV compared to 1.1 eV eV for Si). This leads directly to a lower value for the activation energy (2.9 eV compared to 3.81 eV at 77K). Both materials have very similar Fano factors (approximately 0.11).

Type
30 Years of Energy Dispersive Spectrometry in Microanalysis
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 166 - 167
Copyright
Copyright © Microscopy Society of America

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References

1.Knoll, G. F., Radiation Detectors and Measurements, Second Edition, Wiley, New York 1989.Google Scholar
2.Freck, and Wakefield, , Nature, 193 (1962) 669.CrossRefGoogle Scholar
3.Sareen, R. A., Journal of X-Ray Science and Technology, 4 (1994) 151–165.CrossRefGoogle Scholar
4.Nashashibi, T., Nucl. Instr. and Meth., A332 (1992) 551–556.CrossRefGoogle Scholar
5.Goulding, F.S. and Landis, D. A., IEEE Trans. Nucl. Sci. NS-29, 3, (1982).Google Scholar
6.Delaney, G.F.G. and Finch, E. C., Radiation Detectors, Oxford Science Publications, Clarendon Press, Oxford, 1992.Google Scholar