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Si and Ge Nanowire Growth Mechanisms Observed using In Situ Microscopy

Published online by Cambridge University Press:  31 July 2006

S Kodambaka ,
JB Hannon ,
RM Tromp ,
MC Reuter ,
J Tersoff  and
FM Ross
S Kodambaka
Affiliation:
IBM TJ Watson Research Center
JB Hannon
Affiliation:
IBM TJ Watson Research Center
RM Tromp
Affiliation:
IBM TJ Watson Research Center
MC Reuter
Affiliation:
IBM TJ Watson Research Center
J Tersoff
Affiliation:
IBM TJ Watson Research Center
FM Ross
Affiliation:
IBM TJ Watson Research Center

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 472 - 473
Copyright
© 2006 Microscopy Society of America