Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-29T23:55:44.536Z Has data issue: false hasContentIssue false
  • English
  • Français

SFM Assisted In-Situ by ToF-SIMS: Accessing Chemical Information in True Three Dimensions

Published online by Cambridge University Press:  23 September 2015

Raphaelle Dianoux ,
Adi Scheidemann ,
Ewald Niehuis ,
Rudolf Mollers ,
Felix Kollmer ,
Henrik Arlinghaus ,
Hans-Josef Hug ,
Laetitia Bernard  and
Sasa Vranjkovic
Raphaelle Dianoux
Affiliation:
NanoScan AG, Duebendorf, Switerzland
Adi Scheidemann
Affiliation:
NanoScan AG, Duebendorf, Switerzland
Ewald Niehuis
Affiliation:
ION-TOF GmbH, Muenster, Germany
Rudolf Mollers
Affiliation:
ION-TOF GmbH, Muenster, Germany
Felix Kollmer
Affiliation:
ION-TOF GmbH, Muenster, Germany
Henrik Arlinghaus
Affiliation:
ION-TOF GmbH, Muenster, Germany
Hans-Josef Hug
Affiliation:
Empa, Duebendorf, Switzerland
Laetitia Bernard
Affiliation:
Empa, Duebendorf, Switzerland
Sasa Vranjkovic
Affiliation:
Empa, Duebendorf, Switzerland

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1431 - 1432
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Stipe, B.C., et al, Nature Photonics 4 (2010), p 484.Google Scholar
[2] Sugimoto, Y., et al, Nature 446 (2007), p 64.Google Scholar
[3] Iktgen, K., et al, . in" Secondary Ion Mass Spectrometry", SIMS X., ed. A. Bennighoven, B. Hagenhoff and H.W. Werner, (John Wiley & Son).Google Scholar
[4] The authors acknowledge funding from the European Commission (FP7, Grant number 200613).Google Scholar
[5] Kollmer, F., et al, Surf. Interface Anal 45 (2013), p 312.Google Scholar