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Sensitivity of an Atomic Force Microscope Cantilever with a Crack

Published online by Cambridge University Press:  27 August 2014

Haw-Long Lee ,
Yu-Ching Yang  and
Win-Jin Chang

Abstract

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Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1940 - 1941
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Binnig, G., Quate, C. F., and Gerber, C. Phy. Rev. Lett. 56 (1986) p.930.Google Scholar
[2] Kahrobaiyan, M.H., et al, Int. J. Eng. Sci. 48 (2010)p.1985.Google Scholar
[3] Lee, H.L.and Chang, W.J. Jap. J. Appl. Phys. 51 (2012)p.035202.Google Scholar
[4] Payam, a.F.and Fathipour, M. Arab, J. Sci, Eng, 39 (2014)p.1393.Google Scholar
[5] Shafai, C., Brett, M.J., and Hrudey, T.M. Sensors Actu. A 70 (1998)p.283.Google Scholar
[6] Yang, F., et al, Int. J. Solids Struct. 39 (2002)p.2731.Google Scholar