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SEM/EDS Trace Analysis: Limits Imposed by Fluorescence of the Detector

Published online by Cambridge University Press:  04 August 2017

Dale Newbury ,
Nicholas Ritchie ,
Michael Mengason  and
Keana Scott
Dale Newbury
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, USA.
Nicholas Ritchie
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, USA.
Michael Mengason
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, USA.
Keana Scott
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, USA.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1026 - 1027
Copyright
© Microscopy Society of America 2017 

References

[1] Newbury, D. & Ritchie, N. J. Materials Sci 50 2015). p. 493.Google Scholar
[2] Ritchie, N. NIST DTSA-II available free at: www.cstl .nist.gov/div83 7/837.02/epq/dtsa2/index.html.Google Scholar
[3] Newbury, D. & Ritchie, N. Micros. Microanal 22 2016). p. 520.Google Scholar