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Selfconsistent Electron Beam Charging of Non-Conductive Specimen in SEM and ESEM

Published online by Cambridge University Press:  31 July 2006

H-J Fitting  and
M Touzin
H-J Fitting
Affiliation:
University of Rostockny,Germany
M Touzin
Affiliation:
Ecole Centrale de Lyon,France

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1450 - 1451
Copyright
© 2006 Microscopy Society of America