Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-02T18:43:24.122Z Has data issue: false hasContentIssue false
  • English
  • Français

Selected Reflection Imaging: A Useful Tool for Imaging Nanocomposite Magnetic Materials

Published online by Cambridge University Press:  01 August 2002

Y. Liu ,
Y. Qiang ,
M. J. Yu ,
J. P. Liu  and
D.J. Sellmyer
Y. Liu
Affiliation:
CLAIM, Department of Mechanical Eng. University of Michigan, Ann Arbor, MI 48109-2125 Center for Materials Research and Analysis University of Nebraska, Lincoln, NE 68588
Y. Qiang
Affiliation:
Center for Materials Research and Analysis University of Nebraska, Lincoln, NE 68588
M. J. Yu
Affiliation:
Center for Materials Research and Analysis University of Nebraska, Lincoln, NE 68588
J. P. Liu
Affiliation:
Center for Materials Research and Analysis University of Nebraska, Lincoln, NE 68588
D.J. Sellmyer
Affiliation:
Center for Materials Research and Analysis University of Nebraska, Lincoln, NE 68588

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1354 - 1355
Copyright
Copyright © Microscopy Society of America 2002