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Selected Reflection Imaging: A Useful Tool for Imaging Nanocomposite Magnetic Materials

Published online by Cambridge University Press:  01 August 2002

Y. Liu ,
Y. Qiang ,
M. J. Yu ,
J. P. Liu  and
D.J. Sellmyer
Y. Liu
Affiliation:
CLAIM, Department of Mechanical Eng. University of Michigan, Ann Arbor, MI 48109-2125 Center for Materials Research and Analysis University of Nebraska, Lincoln, NE 68588
Y. Qiang
Affiliation:
Center for Materials Research and Analysis University of Nebraska, Lincoln, NE 68588
M. J. Yu
Affiliation:
Center for Materials Research and Analysis University of Nebraska, Lincoln, NE 68588
J. P. Liu
Affiliation:
Center for Materials Research and Analysis University of Nebraska, Lincoln, NE 68588
D.J. Sellmyer
Affiliation:
Center for Materials Research and Analysis University of Nebraska, Lincoln, NE 68588

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1354 - 1355
Copyright
Copyright © Microscopy Society of America 2002