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Segregation of Bismuth to Triple Junctions in Copper

Published online by Cambridge University Press:  31 January 2003

K.-M. Yin ,
A.H. King ,
T.E. Hsieh ,
F.-R. Chen ,
J.J. Kai  and
L. Chang
K.-M. Yin
Affiliation:
Department of Nuclear Engineering and Engineering Physics, National Tsing Hua University, Hsinchu, Taiwan, Republic of China
A.H. King
Affiliation:
Department of Materials Science & Engineering, 314 Old Engineering, State University of New York at Stony Brook, Nicolls Road, Stony Brook, NY 11794-2275
T.E. Hsieh
Affiliation:
Department of Materials Science and Engineering, National Chiao Tong University, Hsinchu, Taiwan, Republic of China
F.-R. Chen
Affiliation:
Department of Nuclear Engineering and Engineering Physics, National Tsing Hua University, Hsinchu, Taiwan, Republic of China
J.J. Kai
Affiliation:
Department of Nuclear Engineering and Engineering Physics, National Tsing Hua University, Hsinchu, Taiwan, Republic of China
L. Chang
Affiliation:
Department of Materials Science and Engineering, National Chiao Tong University, Hsinchu, Taiwan, Republic of China
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Abstract

Segregation of Bismuth to Triple Junctions in Copper

Type
Research Article
Information
Microscopy and Microanalysis , Volume 3 , Issue 5 , September 1997 , pp. 417 - 422
Copyright
2001 Cambridge University Press

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