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Segregation of Ba to Cr Thin Film and Glass Interfaces

Published online by Cambridge University Press:  02 July 2020

N. Jiang  and
J. Silcox
N. Jiang
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY14853, USA
J. Silcox
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY14853, USA
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Extract

The knowledge of interface properties is important in understanding the adhesion of metal films to glasses. To simplify the analysis, silicate glasses are usually regarded as amorphous SiO2. Comparing the measured energy loss functions of Code 7059 (BaO-B2O3-SiO2) and Code 1737 (Al2O3-B2O3-Si2) glasses by EELS with the calculated result of a-Si02 from optical data, this is a fairly good assumption in bulk materials. Depositing metals, which have strong affinity for oxygen on glasses, however, may result in minor elements, such as Ba in both 7059 and 1737 glasses, segregating to interfaces, and breaking down the chemical balance.

Figs. 1 and 2 show the EELS spectra acquired with a 2Å electron probe in Cr film, interface and bulk glass respectively. The Cr film in Fig. 1 was sputtered on 7059 glass at room temperature, and annealed at 450°C in compressed Ar gas for 10 min. The preparation of Cr thin film in Fig. 2 is mentioned elsewhere.

Type
Future of Microscopy: Ceramics, Composites, and Cement
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 802 - 803
Copyright
Copyright © Microscopy Society of America

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References

1. Jiang, N. and Silcox, J., present in this symposium.Google Scholar

2. Schneider, R.et al., Röder, , Fresenius J Anal. Chem., 353 (1995) 263.CrossRefGoogle Scholar

3. Moreau, P.et al., Phys. Rev. B, 56 (1997) 6774.CrossRefGoogle Scholar

4. Thomas, R.E., Shih, A. and Haas, G., Surf. Sci., 75 (1978) 239.CrossRefGoogle Scholar

5. de Boer, F.R.et al., in Cohesion in Metal: Transition Metal Alloys, North-Holland,Amsterdam (1988) 173.Google Scholar

6. This work is supported by NSF through the Cornell Center for Materials Research. We also thank Ms Zhou, C. and Prof. Li, C-Y. for supplying sputtering sample.Google Scholar