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Seeing is Not Always Believing: Reduction of Artefacts by an Improved Point Resolution With a Spherical Aberration Corrected 200 Kv Transmission Electron Microscope

Published online by Cambridge University Press:  02 July 2020

M. Haider  and
S. Uhlemann
M. Haider
Affiliation:
EMBL, Postfach 102209, D-69012Heidelberg
S. Uhlemann
Affiliation:
on leave to CEOS GmbH, Im Neuenheimer Feld 519, D-69120Heidelberg
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Extract

The most interesting structures in materials science are non-periodic areas where the crystalline structure is disturbed such as interfaces, defects or dislocations. These non-periodic structures can be hidden by artefacts, caused by aberrations, and therefore they can be easier analysed if an aberration free imaging system can be used. Therefore, in order to improve the point resolution and to obtain easier access to the hidden information, a spherical aberration corrected 200 kV TEM, following a proposal by Rose, was set up.

Phase contrast in a transmission electron microscope (TEM) is obtained, as it was shown by Scherzer, due to the phase shifting power of the wave aberrations as there are: the defocus and the spherical aberration. The defocus can be optimised in terms of the well transferred bandwidth of spatial frequencies (Scherzer defocus) Δfsch = (Cs*λ.)1/2. The upper limit of the spatial frequency without a contrast reversal when choosing a Scherzer defocus is called the point resolution d ≈ 0.71 (Cs λ3)1/4.

Type
The Limits of Image Resolution: Seeing is Believing
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 1179 - 1180
Copyright
Copyright © Microscopy Society of America 1997

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References

1 RoseH., , Optik 85(1990) 19Google Scholar

2 O., Scherzer, J. Appl. Phys. 20 (1949) 20Google Scholar

3 The funding of this work by the VW-Foundation is gratefully acknowledged.Google Scholar