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Sectioning of Cultured Cells by Ar Ion Beam Milling for SEM Observations

Published online by Cambridge University Press:  30 July 2020

Shigeyasu Tanaka  and
Yusuke Ohmi
Shigeyasu Tanaka
Affiliation:
Chubu University, Kasugai, Aichi, Japan
Yusuke Ohmi
Affiliation:
Chubu University, Kasugai, Aichi, Japan

Abstract

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Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2692 - 2693
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Copyright
Copyright © Microscopy Society of America 2020

References

Hing, H. L. et al. , Microsc Microanal 13(Suppl 2) (2007) p. 1528.Google Scholar
Tanaka, S. and Ohmi, Y., Microsc Microanal 25(Suppl 2) (2019) p. 902.10.1017/S1431927619005245CrossRefGoogle Scholar
This work was supported in part by JSPS KAKENHI Grant Number JP18K04246.Google Scholar