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Secondary Ion Mass Spectrometry in the TEM: Isotope Specific High Resolution Correlative Imaging.
Published online by Cambridge University Press: 04 August 2017
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- Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 316 - 317
- Copyright
- © Microscopy Society of America 2017
References
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Egerton, R. F.
Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd edition
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