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Secondary Electron Yield Curve for Liquid Water

Published online by Cambridge University Press:  02 July 2020

B.L. Thiel ,
D.J. Stokes  and
D. Phifer
B.L. Thiel
Affiliation:
Polymers and Colloids Group, Cavendish Laboratory, University of Cambridge, Cambridge, UK
D.J. Stokes
Affiliation:
Polymers and Colloids Group, Cavendish Laboratory, University of Cambridge, Cambridge, UK
D. Phifer
Affiliation:
FEI-Philips-Electroscan, 66A Concord Street, Wilmington, MA, USA
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Extract

We have measured the secondary electron yield curve for liquid water using an Environmental SEM. The secondary electron emission coefficient, measured as a function of incident electron energy, is important for interpreting contrast in hydrated biological and inorganic specimens. This information is even more critical for water than other materials, as it is a factor of prime importance in understanding radiation damage in biological tissues.[1]

These measurements were taken using a Philips XL-30 field emission ,ESEM, and repeated on an Electroscan E3 ESEM, equipped with a CeB6 filament. A specially designed Faraday cup was fashioned from brass and fitted with a removable graphite cup having an inset for a platinum aperture. This assembly was placed into an electrically floating Peltier cooling stage, and connected to a KE Instruments probe current meter.

Type
Environmental Scanning Electron Microscopy and Other Wet Work
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 282 - 283
Copyright
Copyright © Microscopy Society of America

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References

[1] Ritchie, R.H., et al, Physical and Chemical Mechanisms in Molecular Radiation Biology, Glass, W.A. and Varma, M.N., eds.. Plenum (1991) 99–135.CrossRefGoogle Scholar

[2] Thiel, B.L., et al,. J. Microscopy, 187 (1997) 143–157.CrossRefGoogle Scholar

[3] Suszcynsky, D.M. and Borovsky, J.E., J. Geophys. Res., 97 (1992) 2611–2619.CrossRefGoogle Scholar

[4] Burke, E.A., IEEE Trans. Nuc. Sci., NS-72 (1980) 1760-1764.Google Scholar