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Secondary, Backscattered and Low Energy Loss electrons in the SEM: Quantification for nano analysis

Published online by Cambridge University Press:  03 August 2008

MM El-Gomati ,
CGH Walker ,
C Bonet ,
SP Tear  and
JAD Matthew
MM El-Gomati
Affiliation:
University of York, United Kingdom
CGH Walker
Affiliation:
University of York, United Kingdom
C Bonet
Affiliation:
University of York, United Kingdom
SP Tear
Affiliation:
University of York, United Kingdom
JAD Matthew
Affiliation:
University of York, United Kingdom
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 908 - 909
Copyright
© 2008 Microscopy Society of America

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