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Scanning Ion Conductance Microscopy for Single Cell Analysis

Published online by Cambridge University Press:  30 July 2020

Petr Gorelkin
Affiliation:
Medical Nanotechnology; National University of Science and Technology MISiS, Moscow, Moskva, Russia
Alexander Erofeev
Affiliation:
National University of Science and Technology ‘‘MISIS"; Lomonosov Moscow State University, Moscow, Moskva, Russia
Andrew Shevchuk
Affiliation:
Imperial College London, London, England, United Kingdom
Pavel Novak
Affiliation:
National University of Science and Technology ‘‘MISIS"; Lomonosov Moscow State University, Moscow, Moskva, Russia
Christopher Edwards
Affiliation:
ICAPPIC Ltd, London, England, United Kingdom
Yuri Korchev
Affiliation:
Imperial College London, London, England, United Kingdom

Abstract

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Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Probe Microscopy and Nanomechanics
Copyright
Copyright © Microscopy Society of America 2020

References

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Acknowledgements. Electrochemical measurements of ROS level were carried out with financial support from the Ministry of Education and Science of the Russian Federation in the framework of increase Competitiveness Program of NUST ‘‘MISIS”, implemented by a governmental decree dated 16th of March 2013, No 211. SICM experiments were supported by the Russian Science Foundation 19-79-30062.Google Scholar