The Scanning Electron Microscopy (SEM) And Energy Dispersive X-Ray Spectroscopy (EDS) For The Study Of The High Temperature Oxidation Mecanisms. The Microscopy In The Center 0f The 0thers Techniques (XPS, XRD, RAMAN and Glow Discharge…).

M. Lameille; E. Buiret; C. Berthier

doi:10.1017/S1431927603443171

The Scanning Electron Microscopy (SEM) And Energy Dispersive X-Ray Spectroscopy (EDS) For The Study Of The High Temperature Oxidation Mecanisms. The Microscopy In The Center 0f The 0thers Techniques (XPS, XRD, RAMAN and Glow Discharge…).

Published online by Cambridge University Press: 21 July 2003

M. Lameille ,

E. Buiret and

C. Berthier

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M. Lameille: Affiliation:
CEA, CE SACLAY, DCC/DPE, 91191 Gif sur Yvette Cedex FRANC
E. Buiret: Affiliation:
CEA, CE SACLAY, DCC/DPE, 91191 Gif sur Yvette Cedex FRANC
C. Berthier: Affiliation:
CEA, CE IDF/DPTA/SP2A/LEMI 91680 Bruyeres le Chate

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Type: Abstract
Information: Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 634 - 635

DOI: https://doi.org/10.1017/S1431927603443171 [Opens in a new window]

Article contents

The Scanning Electron Microscopy (SEM) And Energy Dispersive X-Ray Spectroscopy (EDS) For The Study Of The High Temperature Oxidation Mecanisms. The Microscopy In The Center 0f The 0thers Techniques (XPS, XRD, RAMAN and Glow Discharge…).

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