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Scanning Convergent Beam Electron Diffraction (CBED), the Essential Questions of Why, What and How?

Published online by Cambridge University Press:  01 August 2018

Jian-Min Zuo  and
Yu-Tsun Shao
Jian-Min Zuo
Affiliation:
Department of Materials Science and Engineering and Fredrick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois, USA
Yu-Tsun Shao
Affiliation:
Department of Materials Science and Engineering and Fredrick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 172 - 173
Copyright
© Microscopy Society of America 2018 

References

[1] Zuo, J.M. Spence, J.C.H. "Advanced Transmission Electron Microscopy" 2017 Springer.Google Scholar
[2] Shao, Y. T. Zuo, J. M. Physical Review Letters 118(15 2017) p. 157601.Google Scholar
[3] Kim, K.H., et al, Micron 71 2015) p. 39–45.Google Scholar
[4] Zuo, J. M. Reports on Progress in Physics 67(11 2004) p. 2053.Google Scholar
[5] Tsuda, K. Tanaka, M. Acta Crystallographica Section A 55 1999) p. 939.Google Scholar
[6] Ding Peng, Nakashima, Philip N. H. Journal of Applied Crystallography 50(2 2017) p. 602.Google Scholar
[7] Supported by U.S. DoE, Office of Basic Energy Sciences under contract DEFG02-01ER45923.Google Scholar