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Sample Tilt Effects on Atom Column Position Determination in ABF-STEM Imaging
Published online by Cambridge University Press: 25 July 2016
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- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 890 - 891
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- © Microscopy Society of America 2016
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[4] The authors thank Prof. H.-U. Habermeier for providing the ZrO2-LSMO sample and Marion Kelsch for preparing the plan-view TEM sample, both Max Planck Institute for Solid State Research. The research leading to these results has received funding from the European Union Seventh Framework Programme [FP7/2007-2013] under grant agreement n°312483 (ESTEEM2) and from the Deutsche Forschungsgemeinschaft under contracts RO2057/4-2 and MU3660/1-1. Dan Zhou would also like to thank her current advisor Prof. Paul M. Voyles for supporting her attendace of M&M 2016 to present her PhD work.Google Scholar
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