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Sample Preparation Using Broad Argon Ion Beam Milling for Electron Backscatter Diffraction (EBSD) Analysis

Published online by Cambridge University Press:  25 July 2016

Pawel Nowakowski ,
James Schlenker ,
Mary Ray  and
Paul Fischione
Pawel Nowakowski
Affiliation:
E. A. Fischione Instruments, Inc, 9003 Corporate Circle, Export, PAUSA
James Schlenker
Affiliation:
E. A. Fischione Instruments, Inc, 9003 Corporate Circle, Export, PAUSA
Mary Ray
Affiliation:
E. A. Fischione Instruments, Inc, 9003 Corporate Circle, Export, PAUSA
Paul Fischione
Affiliation:
E. A. Fischione Instruments, Inc, 9003 Corporate Circle, Export, PAUSA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 12 - 13
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Schwarzer, R.A., Field, D.P., Adams, B.L. & Kumar, M. A.J Schwartz Book. Springer (2009). p 1–20.Google Scholar
[2] Wright, S.I., Nowell, M.M. & Field, D.P. Microscopy and Microanalysis 17 (2011). p. 316–329.CrossRefGoogle Scholar
[3] Thomas, J-P, Chauvy, C. & Heurtier, P. Book, EDP Sciences (2004). p. 111–118.Google Scholar
[4] Katrakova, D. & Mucklich, F. Paer I: Metals, Parc Metallog 38 (2001). p. 547–565.Google Scholar
[5] Ma, L. Micron 35 (2004). p. 273–279.CrossRefGoogle Scholar
[6] Michael, J.R. Lucille A. Giannuzzi, Microsc Microanal 13 (2007).Google Scholar
[7] Mayer, J., et al, MRS Bulletin 32 (2007). p. 400–4007.Google Scholar
[8] Knipling, K.E., et al, Materials Characterization 61 (2010). p. 1–6.CrossRefGoogle Scholar