Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
McCartney, Martha R.
and
Smith, David J.
2007.
Electron Holography: Phase Imaging with Nanometer Resolution.
Annual Review of Materials Research,
Vol. 37,
Issue. 1,
p.
729.
Han, Myung-Geun
Fejes, Peter
Xie, Qianghua
Bagchi, Sandeep
Taylor, Bill
Conner, James
and
McCartney, Martha R.
2007.
Quantitative Analysis of 2-D Electrostatic Potential Distributions in 90-nm Si pMOSFETs Using Off-Axis Electron Holography.
IEEE Transactions on Electron Devices,
Vol. 54,
Issue. 12,
p.
3336.
Chung, Suk
Smith, David J.
and
McCartney, Martha R.
2007.
Determination of the Inelastic Mean-Free-Path and Mean Inner Potential for AlAs and GaAs Using Off-Axis Electron Holography and Convergent Beam Electron Diffraction.
Microscopy and Microanalysis,
Vol. 13,
Issue. 5,
p.
329.
Petersen, T. C.
Keast, V. J.
Johnson, K.
and
Duvall, S.
2007.
TEM-based phase retrieval of p–n junction wafers using the transport of intensity equation.
Philosophical Magazine,
Vol. 87,
Issue. 24,
p.
3565.
Han, Myung-Geun
Smith, David J.
and
McCartney, Martha R.
2008.
In situ electron holographic analysis of biased Si n+-p junctions.
Applied Physics Letters,
Vol. 92,
Issue. 14,
Ikarashi, Nobuyuki
Ikezawa, Takeshi
Uejima, Kazuya
Fukai, Toshinori
Miyamura, Makoto
Toda, Akio
and
Hane, Masami
2008.
Electron holography analysis of a shallow junction for planar-bulk metal-oxide-semiconductor field-effect transistors approaching the scaling limit.
Journal of Applied Physics,
Vol. 103,
Issue. 11,
Chung, Suk
Johnson, Shane R.
Ding, Ding
Zhang, Yong-Hang
Smith, David J.
and
McCartney, Martha R.
2009.
Quantitative Analysis of Dopant Distribution and Activation Across p-n Junctions in AlGaAs/GaAs Light-Emitting Diodes Using Off-Axis Electron Holography.
IEEE Transactions on Electron Devices,
Vol. 56,
Issue. 10,
p.
1919.
McCartney, Martha R.
Agarwal, Nipun
Chung, Suk
Cullen, David A.
Han, Myung-Geun
He, Kai
Li, Luying
Wang, Hua
Zhou, Lin
and
Smith, David J.
2010.
Quantitative phase imaging of nanoscale electrostatic and magnetic fields using off-axis electron holography.
Ultramicroscopy,
Vol. 110,
Issue. 5,
p.
375.
Ikarashi, Nobuyuki
Toda, Akio
Uejima, Kazuya
Yako, Koichi
Yamamoto, Toyoji
Hane, Masami
and
Sato, Hiroshi
2010.
Electron holography for analysis of deep submicron devices: Present status and challenges.
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,
Vol. 28,
Issue. 1,
p.
C1D5.
Chung, Suk
Johnson, Shane R.
Ding, Ding
Zhang, Yong-Hang
Smith, David J.
and
McCartney, Martha R.
2010.
Quantitative dopant profiling of p-n junction in InGaAs∕AlGaAs light-emitting diode using off-axis electron holography.
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,
Vol. 28,
Issue. 1,
p.
C1D11.
Pantzer, Adi
Vakahy, Atsmon
Eliyahou, Zohar
Levi, George
Horvitz, Dror
and
Kohn, Amit
2014.
Dopant mapping in thin FIB prepared silicon samples by Off-Axis Electron Holography.
Ultramicroscopy,
Vol. 138,
Issue. ,
p.
36.
Zhu, Jie
Tan, Pik Kee
Tan, Hao
Wang, Dan Dan
Huang, Ya Min
Chen, Chang Qing
Liu, Bing Hai
Er, Eddie
Zhao, Si Ping
Lam, Jeffrey
and
Mai, Zhi Hong
2015.
Crystal thickness and extinction distance measurements by convergent beam electron diffraction fitting and application in quantitative TEM holography analysis on p-n junctions.
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,
Vol. 33,
Issue. 5,
Zweck, Josef
2016.
Imaging of magnetic and electric fields by electron microscopy.
Journal of Physics: Condensed Matter,
Vol. 28,
Issue. 40,
p.
403001.
Carvalho, Daniel
Müller-Caspary, Knut
Schowalter, Marco
Grieb, Tim
Mehrtens, Thorsten
Rosenauer, Andreas
Ben, Teresa
García, Rafael
Redondo-Cubero, Andrés
Lorenz, Katharina
Daudin, Bruno
and
Morales, Francisco M.
2016.
Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction.
Scientific Reports,
Vol. 6,
Issue. 1,
Gribelyuk, M. A.
Mody, J.
Kaganer, E.
Furkay, S. S.
Miller, J.
and
Charsky, A.
2019.
Sample preparation by focused ion beam without argon ion milling for quantitative electron holography of p-n junctions.
Journal of Applied Physics,
Vol. 126,
Issue. 6,
McCartney, Martha R.
Dunin-Borkowski, Rafal E.
and
Smith, David J.
2019.
Quantitative measurement of nanoscale electrostatic potentials and charges using off-axis electron holography: Developments and opportunities.
Ultramicroscopy,
Vol. 203,
Issue. ,
p.
105.
Addiego, Christopher
Gao, Wenpei
Huyan, Huaixun
and
Pan, Xiaoqing
2022.
Probing charge density in materials with atomic resolution in real space.
Nature Reviews Physics,
Vol. 5,
Issue. 2,
p.
117.
Fukushima, Y
Mori, D
Terao, Y
Yamamoto, K
and
Takigawa, A
2023.
Band-bending Analysis of Metal-Oxide-Semiconductor (MOS) Interface by In Situ Biasing Electron Holography.
Microscopy and Microanalysis,
Vol. 29,
Issue. Supplement_1,
p.
1338.