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RISE - Raman SEM Imaging of Single Layer and Twisted Bilayer Graphene

Published online by Cambridge University Press:  04 August 2017

Ute Schmidt ,
Hans Zimmermann ,
Stefanie Freitag  and
Thomas Dieing
Ute Schmidt
Affiliation:
WITec GmbH, Ulm, Germany (www.witec.de)
Hans Zimmermann
Affiliation:
Carl Zeiss Microscopy GmbH, Munich, Germany (www.zeiss.com)
Stefanie Freitag
Affiliation:
Carl Zeiss Microscopy GmbH, Munich, Germany (www.zeiss.com)
Thomas Dieing
Affiliation:
WITec GmbH, Ulm, Germany (www.witec.de)

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1748 - 1749
Copyright
© Microscopy Society of America 2017 

References

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