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A Review of Recent Developments in Low Energy Ion Scattering (LEIS) and Its Applications

Published online by Cambridge University Press:  25 July 2016

Philipp Brüner ,
Thomas Grehl ,
Hidde H. Brongersma  and
Ewald Niehuis
Philipp Brüner
Affiliation:
ION-TOF GmbH, Münster, Germany
Thomas Grehl
Affiliation:
ION-TOF GmbH, Münster, Germany
Hidde H. Brongersma
Affiliation:
ION-TOF GmbH, Münster, Germany
Ewald Niehuis
Affiliation:
ION-TOF GmbH, Münster, Germany

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 358 - 359
Copyright
© Microscopy Society of America 2016 

References

References:

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[2] Burriel, M., et al, Energy Environ. Sci 7 (2014). p. 311.CrossRefGoogle Scholar
[3] Druce, J., et al, Nucl. Instr. Meth. B 332 (2014). p. 261.Google Scholar
[4] Fuchs, M., et al, Surf. Interface. Anal 42 (2010). p. 1131.CrossRefGoogle Scholar