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A Review of Electron Channeling Contrast Imaging for Non-Destructive Defect Analysis of Crystalline Solids

Published online by Cambridge University Press:  01 August 2018

Yoosuf N. Picard
Yoosuf N. Picard*
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 630 - 631
Copyright
© Microscopy Society of America 2018 

References

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[4] Dingley, DJ Scanning Electron Microscopy 11 1984) p. 569.Google Scholar