Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-09T22:53:28.039Z Has data issue: false hasContentIssue false
  • English
  • Français

Reversal Mechanisms in Lithographically Defined Magnetic Thin Film Elements Imaged by Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  31 January 2003

Stephen McVitie  and
John N. Chapman
Stephen McVitie
Affiliation:
Department of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, U.K.
John N. Chapman
Affiliation:
Department of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, U.K.
Get access

Abstract

Abstract: The magnetic behavior of lithographically defined thin film elements of permalloy imaged by Lorentz microscopy is described. Elements of thickness <100 nm, with in-plane dimensions in the micron and sub-micron range and of varying shape, have been subjected to in situ fields using an electron microscope that has been optimized for magnetic imaging. The information provided from the imaging modes has identified the details of the magnetization reversal mechanisms in the elements during the course of a hysteresis cycle. In particular, domain wall clusters which form at the edges of the elements are observed prior to switching of the magnetization. Results are described from elements with near single and multidomain structures with different geometry.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 3 , Issue 2 , March 1997 , pp. 146 - 153
Copyright
2001 Cambridge University Press

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)