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Revealing the Origin of “Phonon Glass-Electron Crystal” Behavior in Thermoelectric Layered Cobaltate by Accurate Displacement Measurement

Published online by Cambridge University Press:  27 August 2014

L. Wu ,
Q. Meng ,
Ch. Jooss ,
J.-C. Zheng ,
H. Inada ,
D. Su ,
Q. Li  and
Y. Zhu
L. Wu
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973 USA
Q. Meng
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973 USA
Ch. Jooss
Affiliation:
University of Goettingen, Goettingen, Germany
J.-C. Zheng
Affiliation:
Xiamen University, Xiamen, China
H. Inada
Affiliation:
Hitachi High Technologies Corp., Ibaraki Japan
D. Su
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973 USA
Q. Li
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973 USA
Y. Zhu
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973 USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 434 - 435
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Wu, L., Meng, Q., Jooss, Ch., Zheng, J.-C., Inada, H., Su, D., Li, Q., and Zhu, Y. Adv. Funct. Mater. 23, 5728-5736 (2013).Google Scholar
[2] Work was supported by the U.S. DOE, Office of Basic Energy Science, Material Science and Engineering Division, under Contract No. DE-AC02-98CH10886.Google Scholar