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Revealing the Dopant Incorporation Mechanisms into Vapor-Liquid-Solid Grown NWs Employing Nano-Prope Scanning Auger Microscopy

Published online by Cambridge University Press:  27 August 2014

U. Givan ,
D. F. Paul ,
J. S. Hammond ,
Y. Rosenwaks ,
S. Christiansen  and
L.J. Lauhon
U. Givan
Affiliation:
Institute for Nano-Architectures for Energy Conversion, Helmholtz-Zentrum-Berlin, Berlin, Germany and Max Planck Institute for the Science of Light, Erlangen, Germany Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA
D. F. Paul
Affiliation:
Physical Electronics Inc., Chanhassen, MN, USA
J. S. Hammond
Affiliation:
Physical Electronics Inc., Chanhassen, MN, USA
Y. Rosenwaks
Affiliation:
Department of Physical Electronics, Tel-Aviv University, Israel
S. Christiansen
Affiliation:
Institute for Nano-Architectures for Energy Conversion, Helmholtz-Zentrum-Berlin, Berlin, Germany and Max Planck Institute for the Science of Light, Erlangen, Germany
L.J. Lauhon
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 2090 - 2091
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Amit, I., et al, Nano letters 13 (2013), P. 2598–2604.Google Scholar
[2] Koren, E., et al, Nano letters 11 (2011), P. 183–187.Google Scholar
[3] Hyun, J. K., et al, Proc. IEEE Conference on Nanotechnology (2010), P. 131-135. [4] K.D. Childs, et al, “Handbook of Auger Electron Spectroscopy”, (Physical Electronics Inc., USA, 1995).Google Scholar