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Retrofittable Laser-free kHz to GHz Tunable Pulser for Ultra-fast Electron Microscopy

Published online by Cambridge University Press:  30 July 2020

Chunguang Jing
Affiliation:
Euclid Techlabs, LLC, Bolingbrook, Illinois, United States
Ao Liu
Affiliation:
Euclid Techlabs, LLC, Bolingbrook, Illinois, United States
Eric Montgomery
Affiliation:
Euclid Techlabs, LLC, Bolingbrook, Illinois, United States
Yubin Zhao
Affiliation:
Euclid Techlabs, LLC, Bolingbrook, Illinois, United States
Hyeokmin Choe
Affiliation:
Euclid Techlabs, LLC, Bolingbrook, Illinois, United States
Alexei Kanareykin
Affiliation:
Euclid Techlabs, LLC, Gaithersburg, Maryland, United States
June Lau
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland, United States
Xuewen Fu
Affiliation:
Brookhaven National Laboratory, Upton, New York, United States
Yimei Zhu
Affiliation:
Brookhaven National Laboratory, Upton, New York, United States

Abstract

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Type
Vendor Symposium - Imaging and Analysis
Copyright
Copyright © Microscopy Society of America 2020

References

Lobastov, VA, Srinivasan, R, Zewail, AH., Natl. Acad. Sci. 102 (2005) 70697073.10.1073/pnas.0502607102CrossRefGoogle Scholar
Flannigan, A. Zewail, , Accounts Chem. Res.,vol. 45, p. 1828 (2012).10.1021/ar3001684CrossRefGoogle Scholar
Zewail, , “Four-Dimensional Electron Microscopy”, Science, 328 (5975), pp. 187193 (2010).10.1126/science.1166135CrossRefGoogle ScholarPubMed
Kisielowski, C, et al. Discovering hidden material properties of MgCl2 at atomic resolution with structured temporal electron illumination of picosecond time resolution. Funct. Mater. 2019, 29, 1807818.10.1002/adfm.201807818CrossRefGoogle Scholar
Jing, , et al. , Tunable electron beam pulser for picoseconds stroboscopic microscopy in transmission electron microscopes, Ultramicroscopy, 207, December 2019, 11282910.1016/j.ultramic.2019.112829CrossRefGoogle ScholarPubMed
VandenBussche, Elisah J. and Flannigan, David J., Reducing Radiation Damage in Soft Matter with Femtosecond-Timed Single-Electron Packets, Nano Lett. 2019, 19, 66876694.10.1021/acs.nanolett.9b03074CrossRefGoogle ScholarPubMed
Lau, June W., et al. , Laser-free GHz stroboscopic TEM: components, system integration, and practical considerations for pump-probe measurements, invited paper, Sci. Inst. 2020, to appear.Google Scholar