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Resolving Multilayer Structure of Pressure Sensitive Adhesive by Atomic Force Microscopy (AFM)

Published online by Cambridge University Press:  01 August 2018

Hu Duan  and
Shuang Qin
Hu Duan
Affiliation:
Materials Science and Characterization, Avery Dennison Corporation, Mentor, OH44060, USA
Shuang Qin
Affiliation:
Materials Science and Characterization, Avery Dennison Corporation, Mentor, OH44060, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1078 - 1079
Copyright
© Microscopy Society of America 2018 

References

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