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Resolving Atomic Scale Chemistry and Structure at NO and Ba Passivated SiC/SiO2Interfaces

Published online by Cambridge University Press:  25 July 2016

J. Houston Dycus ,
Weizong Xu ,
Daniel J. Lichtenwalner ,
Brett Hull ,
John W. Palmour  and
James M. LeBeau
J. Houston Dycus
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina27695, USA
Weizong Xu
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina27695, USA
Daniel J. Lichtenwalner
Affiliation:
Power Devices R&D, Wolfspeed, a Cree Company, 3028 E.Cornwallis Road, RTP, North Carolina27709, USA
Brett Hull
Affiliation:
Power Devices R&D, Wolfspeed, a Cree Company, 3028 E.Cornwallis Road, RTP, North Carolina27709, USA
John W. Palmour
Affiliation:
Power Devices R&D, Wolfspeed, a Cree Company, 3028 E.Cornwallis Road, RTP, North Carolina27709, USA
James M. LeBeau
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina27695, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1658 - 1659
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Lichtenwalner, D. J., et al, Applied Physics Letters 105(18 (2014).Google Scholar
[2] Zheleva, T., et al, Applied Physics Letters 93(2 (2008).Google Scholar
[3] Chang, K.-C., et al, Journal of Applied Physics 97(10 (2005).Google Scholar
[4] Dycus, J. H., et al, Applied Physics Letters 102(8 (2013).Google Scholar
[5] Sang, X. & LeBeau, J. M. Ultramicroscopy 138 (2014). p. 28–35.Google Scholar
[6] Sang, X., et al, Microscopy and Microanalysis 20 (2014). p. 1764–1771.Google Scholar
[7] Dycus, J. H., et al, Microscopy and Microanalysis 21 (2015). p. 946–952.CrossRefGoogle Scholar
[8] Oni, A. A., et al, Applied Physics Letters 106(1 (2015).CrossRefGoogle Scholar
[9] JHD, WX and JML acknowledge the Analytical Instrumentation Facility (AIF) at North Carolina State University. JHD acknowledges support by the National Science Foundation Graduate Research Fellowship (Grant DGE-1252376). Research was sponsored by the Army Research Laboratory under Cooperative Agreement #W911NF-12-2-0064.Google Scholar