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Repeatability of Automated FIB Prepared TEM Samples with Low keV Cleaning

Published online by Cambridge University Press:  01 August 2010

M Moriarty ,
J Blackwood  and
J Arjavac
M Moriarty
Affiliation:
FEI Company
J Blackwood
Affiliation:
FEI Company
J Arjavac
Affiliation:
FEI Company

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 204 - 205
Copyright
Copyright © Microscopy Society of America 2010