Hostname: page-component-78c5997874-t5tsf Total loading time: 0 Render date: 2024-11-03T08:01:30.115Z Has data issue: false hasContentIssue false
  • English
  • Français

Relative Variation of K- And L-Shell Ionization Cross Sections by Electron Impact

Published online by Cambridge University Press:  02 July 2020

X. Llovet ,
C. Merlet ,
J.M. Fernández-Varea  and
F. Salvat
X. Llovet
Affiliation:
Serveis Científico-Tècnics. Univ. Barcelona. Lluís Solé i Sabarís, 1-3., 08028, Barcelona., Spain
C. Merlet
Affiliation:
ISTEEM. Université de Montpellier II. PI. E. Bataillon. 34095, Montpellier, Cedex 5., France
J.M. Fernández-Varea
Affiliation:
Facultat de Física (ECM), Universitat de Barcelona. Diagonal 647., 08028, Barcelona., Spain
F. Salvat
Affiliation:
Facultat de Física (ECM), Universitat de Barcelona. Diagonal 647., 08028, Barcelona., Spain
Get access

Extract

Knowledge of inner-shell ionization cross sections by electron impact is needed for quantitative procedures in electron probe microanalysis (EPMA) and Auger electron spectroscopy (AES) The common practice is to use semi-empirical formulas, based on the asymptotic limit of the Bethe theory, which sometimes are used beyond their domain of validity. Experimental measurements of ionization cross sections are scarce and affected by considerable uncertainties, thus a mere comparison with experimental data does not permit to draw a definite conclusion abou the accuracy of the various formulas. In this communication, we present new measurements o the relative variation of K- and L-shell ionization cross sections deduced from the counting rate of characteristic x-rays emitted by extremely thin films of Cr, Ni, Cu, Te, Au and Bi bombardec by keV electrons.

The studied films were produced by thermal evaporation on backing self-supported 30 nm carbon films.

Type
Mas Celebrates: Fifty Years of Electron Probe Microanalysis
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 584 - 585
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Merlet, C., Proc. Microbearn Anal, ed. by Etz, E.S., VCH Publishers (1995) 203Google Scholar
2.Baró, J.et.alNucl. Instr. and Meth. B, 100 (1995) 31CrossRefGoogle Scholar
3.Mayol, R. and Salvat, F., J. Phys. B: At. Mol. Opt. Phys., 23 (1990) 2117CrossRefGoogle Scholar
4.Gryzinski, M., Phys. Rev., 138 (1965) 336.CrossRefGoogle Scholar
5.Worthington, C.R. and Tomlin, S.G. 1956, Proc. Phys. Soc, A 69 (1956) 401CrossRefGoogle Scholar
6.Casnati, E.A.et.alJ. Phys. B: At. Mol Opt. Phys., 15 (1982) 155CrossRefGoogle Scholar
7.Fernández-Varea, J.M.et.al to be published.Google Scholar