Hostname: page-component-cd9895bd7-jkksz Total loading time: 0 Render date: 2025-01-01T03:34:31.376Z Has data issue: false hasContentIssue false
  • English
  • Français

Reinvestgation of Tweed Microstructures in Annealed Albite

Published online by Cambridge University Press:  02 July 2020

Y. J. Kim ,
S. H. Lee  and
J. C. Lee
Y. J. Kim
Affiliation:
Korea Baic Science Institute, Yusung P. O. Box 41, Taejeon, 305-600, Republic of Korea
S. H. Lee
Affiliation:
Korea Baic Science Institute, Yusung P. O. Box 41, Taejeon, 305-600, Republic of Korea
J. C. Lee
Affiliation:
Korea Baic Science Institute, Yusung P. O. Box 41, Taejeon, 305-600, Republic of Korea
Get access

Extract

Previous TEM study of natural Amelia albite (Ab99.3An0.1Or0.6) isothermally annealed at 1073°C for various periods revealed distinct tweed microstructures from the intermediately disordered albite samples (intermediate albite), but not from both the natural sample (low albite) and the highly disordered samples (high albite).1 These tweed microstructures seemed to correlate well with the degree of peak broadening and distortion in corresponding conventional powder X-ray diffractograms. Previous XRD, synchrotron radiation and TEM studies on the annealed albite samples at 1080°C for various periods gave rise to similar results.

Reinvestigation of the annealed albite samples with distinct tweed microstructures by TEM confirmed their existence in wide areas, giving two-directional streaking in the corresponding SADP’s (Fig. 1 and 2). Tweed directions are roughly perpendicular to and parallel to the trace of albite twin plane, {010}, as shown in Fig. 3. This tweed microstructure is apparently unaffected by the twinning and probably formed after it.

Type
Geology and Mineralogy
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 763 - 764
Copyright
Copyright © Microscopy Society of America 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Kim, Y. J. and Henderson, D. M., Proceedings of ICEM 12, (1990)1064.Google Scholar
Wruck, B.et al., Physics and Chemstry of Minerals, 17(1991)700.Google Scholar